Evidence map›Paper›PMID 42797131›Full record

ArticlePolymers2026

Effect of Acid-Labile Protecting-Group Structure on the Micrometer-Scale Patterning Performance of Core-First RAFT-Synthesized Three-Arm Photoresists.

Jinyoung Kim, Yura Choi, Eunsu Park, Kyeongjin Jang, Hyungjun Noh, Namchul Cho

Abstract read
In one paragraph

Article in Polymers, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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1 · What the graph read from it

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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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3 · Its place in the literature

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4 · The record

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5 · Who and what money

Authors and funding

6 authors.

Jinyoung KimDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.
Yura ChoiDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.ORCID 0009-0003-2537-4631
Eunsu ParkDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.
Kyeongjin JangDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.
Hyungjun NohDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.
Namchul ChoDepartment of Energy Engineering, Soonchunhyang University, 22 Soonchunhyang-ro, Asan 31538, Republic of Korea.

Funding

Korea Institute of Energy Technology Evaluation and Planning RS-2024-00394769the Ministry of Climate, Energy & Environment (MCEE) RS-2024-00394769
6 · The paper itself

Abstract

Controlling dimensional fidelity and line-edge roughness is important in chemically amplified negative-tone imaging. In this study, two three-arm random terpolymers containing different acid-labile protecting groups were synthesized via core-first reversible addition-fragmentation chain-transfer (RAFT) polymerization to examine the influence of protecting-group structure within a common star-polymer framework. HTT 334 contained tert-butyl methacrylate (t-BMA), whereas HTM 334 contained 2-methyl-2-adamantyl methacrylate (MAMA). The two polymers exhibited comparable molecular weights and compositions, with narrow dispersities of 1.14 and 1.16. Thermal analysis showed that HTM 334 had a slightly higher glass-transition temperature than HTT 334 (77 and 73 °C, respectively). Fourier transform infrared (FT-IR) spectroscopy revealed spectral changes after exposure and post-exposure baking (PEB) that were consistent with acid-catalyzed deprotection and possible intermolecular reactions involving the hydroxyethyl methacrylate units. Negative-tone patterns were formed using an n-butyl acetate developer under the selected PEB conditions of 70 °C for HTT 334 and 90 °C for HTM 334. Across nominal mask dimensions of 10-80 μm, HTM 334 exhibited printed-to-mask critical-dimension ratios of 0.990-1.039, compared with 0.915-1.003 for HTT 334. HTM 334 also showed lower measured line-edge roughness values of 0.22-0.39 μm than HTT 334, which showed values of 0.52-1.27 μm. At the nominal 10 μm dimension, HTM 334 exhibited a line-edge roughness of 0.27 μm and an LER/CD ratio of 2.60%. These results indicate that an acid-labile protecting-group structure can influence thermal behavior and micrometer-scale pattern fidelity within the investigated three-arm RAFT polymer platform.

Indexed as

acid-labile protecting groupchemically amplified photoresistcritical-dimension fidelityline-edge roughness (LER)micrometer-scale patterningnegative-tone imaging (NTI)RAFT polymerizationthree-arm star polymer

Identifiers

PMID42797131
PMCPMC13611456

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