← Evidence map

ArticleMicromachines2026

A Comprehensive Experimental and Finite Element Analysis Study on the Bonding Strength Evaluation of Wafer-to-Wafer Hybrid Bonding with Polyimide Film Dielectrics.

Cong Mei et al.PubMed ↗Full text ↗Publisher ↗

No numbers read from the abstract.

Not cited yet

Full record →Abstract, authors, funding and every citing paper · PMID 42195542