Evidence map›Paper›PMID 31814992›Full record

ArticleMicrosystems & nanoengineering2019

Displacement Talbot lithography for nano-engineering of III-nitride materials.

Pierre-Marie Coulon, Benjamin Damilano, Blandine Alloing, Pierre Chausse, Sebastian Walde, Johannes Enslin, Robert Armstrong, Stéphane Vézian, Sylvia Hagedorn, Tim Wernicke and 5 more

Open access · goldAbstract read
In one paragraph

Article in Microsystems & nanoengineering, 2019. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 12 papers.

0numbers the graph read from it
0cells of the map it votes in
12citing papers in PubMed
5.1field-weighted citation impact, top 4% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

12 citing papers in PubMed, 47 citations in OpenAlex.

  1. Superlattice Architectures for Advancing Photothermal Catalysis: Mechanisms and Applications.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2026
    Review
  2. Article
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  7. Review
  8. Article
  9. Tunneling-induced Talbot effect.Scientific reports · 2021
    Article
  10. Article
  11. Article
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

15 authors at 4 institutions in 3 countries.

Pierre-Marie Coulon1Department of Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY UK.ORCID 0000-0002-9120-7554
Benjamin Damilano2Université Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560 Valbonne, France.
Blandine Alloing2Université Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560 Valbonne, France.
Pierre Chausse1Department of Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY UK.
Sebastian WaldeFerdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany.
Johannes Enslin4Technische Universität Berlin, Institute of Solid State Physics, 10623 Berlin, Germany.
Robert Armstrong1Department of Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY UK.
Stéphane Vézian2Université Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560 Valbonne, France.
Sylvia HagedornFerdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany.
Tim Wernicke4Technische Universität Berlin, Institute of Solid State Physics, 10623 Berlin, Germany.
Jean Massies2Université Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560 Valbonne, France.
Jesus Zúñiga-Pérez2Université Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560 Valbonne, France.
Markus WeyersFerdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany.
Michael KneisslFerdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany.
Philip A Shields1Department of Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY UK.
Centre National de la Recherche Scientifique · FRFerdinand-Braun-Institut · DEUniversity of Bath · GBTechnische Universität Berlin · DE

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Nano-engineering III-nitride semiconductors offers a route to further control the optoelectronic properties, enabling novel functionalities and applications. Although a variety of lithography techniques are currently employed to nano-engineer these materials, the scalability and cost of the fabrication process can be an obstacle for large-scale manufacturing. In this paper, we report on the use of a fast, robust and flexible emerging patterning technique called Displacement Talbot lithography (DTL), to successfully nano-engineer III-nitride materials. DTL, along with its novel and unique combination with a lateral planar displacement (D

Indexed as

Electrical and electronic engineeringNanophotonics and plasmonicsNanowires

Identifiers

PMID31814992
PMCPMC6885515
OpenAlexW2974349096

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.