ArticleSensors (Basel, Switzerland)2026
Methods for Rapid and Smart Characterization of Vanadium Oxide Thin Films and Thermally Aged Samples Using Raman Spectroscopy and Multivariate Analysis.
Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Vanadium oxides (VOxs) are technologically important materials because of their versatile properties, including a reversible metal-insulator transition. However, the complex vanadium-oxygen phase diagram includes numerous stable stoichiometries and metastable polymorphs, making material identification challenging. This work presents a data-driven, nondestructive characterization workflow that combines Raman spectroscopy and principal component analysis (PCA) to provide rapid and intelligent feedback during VOx thin-film fabrication. Although Raman spectroscopy provides ultrasensitive chemical information, conventional spectral interpretation requires specialized expertise and extensive reference data. An in-house fabrication protocol based on spin-casting chemical precursors and thermal annealing was developed to produce thin-film standards of VO
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