Evidence map›Paper›PMID 42860603›Full record

ArticleAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2026

Lattice Disorder in CuI Enables Filament-Free Transparent Memristors.

Yuzhao Ouyang, Ke Qu, Haonan Wang, Jianquan Liu, Wei Li, Zhuoran Ji, Jialin Yang, Qiuxiang Zhu, Zhenzhong Yang, Xiaodong Tang and 4 more

Abstract read
In one paragraph

Article in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Yuzhao Ouyang *Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0009-0003-6065-9405
Ke Qu *Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Haonan Wang *Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Jianquan LiuKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Wei LiKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Zhuoran JiKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Jialin YangKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Qiuxiang ZhuKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-3515-315X
Zhenzhong YangKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-7226-7973
Xiaodong TangKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.
Hui PengKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-9062-2799
Bobo TianKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-4251-2755
Chungang DuanKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-5380-4980
Chang YangKey Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Information and Electronic Engineering, East China Normal University, Shanghai, China.ORCID https://orcid.org/0000-0002-1380-9533

Funding

Fundamental Research Funds for the Central UniversitiesNational Key R&D Program of China 2021YFA1200700National Key R&D Program of China 2022YFA1402902National Key R&D Program of China 2024YFA1410700National Natural Science Foundation of China 52572129National Natural Science Foundation of China 62474066Science and Technology Commission of Shanghai Municipality 24JD1401200
6 · The paper itself

Abstract

The realization of invisible neuromorphic electronics hinges on transparent memories that reconcile high optical transparency with stable analog tunability, which is a challenge unmet by conventional filamentary devices. Here, we introduce an alloyed Cu

Indexed as

distributed ion migrationfilament‐free switchinginterfacial barrier modulationneuromorphic electronicsP‐type transparent memristor

Identifiers

PMID42860603
PMCPMC13655244

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.