← Evidence map

ArticleJournal of materials science. Materials in electronics2026

Bandgap engineering of tantalum nitride thin films by ion‑assisted magnetron sputtering for advanced electronic and radiation detection applications.

Galina Nagicheva et al.PubMed ↗Full text ↗Publisher ↗

No numbers read from the abstract.

Not cited yet

Full record →Abstract, authors, funding and every citing paper · PMID 42851592