ArticleJournal of applied crystallography2026
Probing local atomic structure in thin films by grazing-incidence total X-ray scattering with a convergent X-ray beam.
Article in Journal of applied crystallography, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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Authors and funding
3 authors.
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Abstract
Grazing-incidence total X-ray scattering (GI-TXS) is an important technique for evaluating the short-range order and medium-range order structures of thin films. A high-quality pair distribution function requires high-intensity total scattering data over a wide scattering vector magnitude (
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