Evidence map›Paper›PMID 42817549›Full record

ArticleSensors (Basel, Switzerland)2026

A Lightweight PCB Defect Detection Method Based on Heterogeneous Feature Enhancement and Discrepancy-Guided Fusion.

Yujie Pei, Xuehong Gao, Shenyuan Gao, Yongchang Zhang, Ying Liu, Guozhong Huang, Lili Lei

Abstract read
In one paragraph

Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Yujie PeiResearch Institute of Macro-Safety Science, University of Science and Technology Beijing, Beijing 100083, China.
Xuehong GaoResearch Institute of Macro-Safety Science, University of Science and Technology Beijing, Beijing 100083, China.ORCID 0000-0002-3840-0275
Shenyuan GaoResearch Institute of Macro-Safety Science, University of Science and Technology Beijing, Beijing 100083, China.
Yongchang ZhangKey Laboratory of Automotive Chip Testing and Evaluation, State Administration for Market Regulation, Beijing National New Energy Vehicle Technology Innovation Center Co., Ltd., Beijing 100176, China.
Ying LiuKey Laboratory of Automotive Chip Testing and Evaluation, State Administration for Market Regulation, Beijing National New Energy Vehicle Technology Innovation Center Co., Ltd., Beijing 100176, China.
Guozhong HuangResearch Institute of Macro-Safety Science, University of Science and Technology Beijing, Beijing 100083, China.
Lili LeiKey Laboratory of Automotive Chip Testing and Evaluation, State Administration for Market Regulation, Beijing National New Energy Vehicle Technology Innovation Center Co., Ltd., Beijing 100176, China.

Funding

State Administration for Market Regulation Grant No.QCXP202504
6 · The paper itself

Abstract

Accurate detection of small and weak defects is essential for ensuring the manufacturing quality and operational reliability of printed circuit boards (PCBs). Existing detectors, however, remain constrained by insufficient fine-grained feature representation, interference from repetitive conductive backgrounds, localization instability, and excessive computational complexity. To address these limitations, a lightweight defect detection model, termed Compact Recalibration and Fusion YOLO (CRF-YOLO), is developed based on YOLO11n. C3k2-Lite integrates partial-channel spatial modeling with cross-stage feature aggregation, reducing redundant computation while retaining essential defect information. The Residual Feature Fusion Attention module (RFFA) performs heterogeneous defect-evidence decomposition by jointly encoding positional, boundary, connectivity, and texture cues. Independently gated evidence aggregation and dual-dimensional feature recalibration strengthen weak contour interruptions, abnormal conductive connections, and subtle texture disturbances embedded in complex circuit backgrounds. The Residual Cross-Fusion module (RCF) establishes discrepancy-guided dual-stream feature reconciliation between the original and attention-enhanced representations. Location-adaptive feature selection and structure-aware detail reconstruction preserve low-amplitude defect cues while selectively incorporating discriminative information. Shape-NWD is adopted to improve the localization stability of small, elongated, and geometrically irregular defects. Experimental results show that CRF-YOLO achieves a Precision of 95.53%, a Recall of 91.26%, an mAP@0.5 of 94.46%, and an mAP@0.5:0.95 of 51.74%, with 2.175 M parameters and 6.0 GFLOPs. Compared with representative mainstream object detectors, the proposed model delivers superior overall detection performance while maintaining more favorable lightweight characteristics. A browser-based inspection interface is also implemented to support image uploading, automated defect detection, and result visualization, demonstrating the practical deployment potential of the proposed approach.

Indexed as

heterogeneous feature enhancementindustrial defect detectionlightweight detectionprinted circuit board

Identifiers

PMID42817549
PMCPMC13611695

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.