Evidence map›Paper›PMID 42816496›Full record

ArticleMicrosystems & nanoengineering2026

Robust structural superlubric interfaces under high current density, from understandings to applications.

Tielin Wu, Weipeng Chen, Yelingyi Wang, Dinglin Yang, Xiaoqi Yang, Deli Peng, Ze Liu, Cangyu Qu, Changheng Zhuang, Jin Wang and 3 more

Abstract read
In one paragraph

Article in Microsystems & nanoengineering, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Tielin WuCollege of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China.
Weipeng ChenCenter for Nano and Micro Mechanics, Tsinghua University, Beijing, China.ORCID http://orcid.org/0009-0004-5175-6868
Yelingyi WangTsinghua Shenzhen International Graduate School, Shenzhen, China.
Dinglin YangCenter for Nano and Micro Mechanics, Tsinghua University, Beijing, China.
Xiaoqi YangDepartment of Engineering Mechanics, School of Civil Engineering, Wuhan University, Wuhan, China.
Deli PengTsinghua Shenzhen International Graduate School, Shenzhen, China.ORCID http://orcid.org/0000-0002-6832-2052
Ze LiuDepartment of Engineering Mechanics, School of Civil Engineering, Wuhan University, Wuhan, China.ORCID http://orcid.org/0000-0002-9906-5351
Cangyu QuDepartment of Mechanical Engineering and Applied Mechanics, University of Pennsylvania, Philadelphia, PA, USA.
Changheng ZhuangTsinghua Shenzhen International Graduate School, Shenzhen, China.
Jin WangInternational School for Advanced Studies (SISSA), Trieste, Italy. jinwang@sissa.it.ORCID http://orcid.org/0000-0002-3924-2942
Xiaojian XiangInstitute of Superlubricity Technology, Research Institute of Tsinghua University in Shenzhen, Shenzhen, China. neu_xiangxiaojian@163.com.
Quanshui ZhengTsinghua Shenzhen International Graduate School, Shenzhen, China.
Zhanghui WuCollege of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China. wuzh2025@szu.edu.cn.ORCID http://orcid.org/0000-0002-2505-0050

Funding

National Natural Science Foundation of China (National Science Foundation of China) 12502131Shenzhen Science and Technology Innovation Commission JSGG20220831095802004Shenzhen Science and Technology Innovation Commission KQTD20240729102211015
6 · The paper itself

Abstract

Structural superlubricity (SSL) exhibits significant potential for applications in micro/nanoelectromechanical systems, switches, and sensors, owing to its characteristics of near-zero friction and zero wear. However, the deployment of the more universal 2D/3D SSL interfaces in efficient electronics is severely limited by an insufficient understanding of their electrical stability and failure mechanisms under high current density. In contrast to the Joule-heating-induced interlayer bonding that limits the critical current density in 2D/2D SSL interfaces, we report a fundamentally different failure mechanism for 2D/3D SSL interfaces under high current density: the interfacial Au layer melts and transitions from single-crystalline to polycrystalline state, which drastically increases surface roughness and thus causes a friction surge, severe graphite wear, and the eventual collapse of the SSL state. Notably, under this new failure mechanism, the critical current density of the interface increases by nearly an order of magnitude compared to that of 2D/2D SSL interfaces, exceeding 110 GA/m². Furthermore, we developed a high-power switch prototype that significantly outperforms conventional ones, demonstrating a critical step in translating SSL from principle to practice and paving the way for addressing contact issues in high-power, long-life electronics.

Identifiers

PMID42816496
PMCPMC13627659

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.