Evidence map›Paper›PMID 42780468›Full record

ArticleNature electronics2026

A cracking-assisted transfer printing technology for high-resolution quantum dot light-emitting diode displays.

Jeong-Wan Jo, Yoonwoo Kim, Sanghyo Lee, Jiajie Yang, Yaron Bernstein, Giovanni Francesco Cotella, Feng Zhao, Quan Lyu, Thomas E Davies, Faris Abualnaja and 8 more

Abstract read
In one paragraph

Article in Nature electronics, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

18 authors.

Jeong-Wan Jo *Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-4341-6810
Yoonwoo Kim *Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0009-0009-9908-0699
Sanghyo LeeElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0003-1740-0820
Jiajie YangElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.
Yaron BernsteinElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.
Giovanni Francesco CotellaHuawei Technologies Research and Development, Ipswich, UK.
Feng ZhaoHuawei Technologies, Shenzhen, China.
Quan LyuHuawei Technologies Research and Development, Cambridge, UK.
Thomas E DaviesSchool of Chemistry, Cardiff University, Cardiff, UK.ORCID 0000-0002-8930-5067
Faris AbualnajaElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-6689-2377
Greg ChuElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0009-0001-8547-7048
Hannah J JoyceElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-9737-680X
Stephan HofmannElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0001-6375-1459
Jack A Alexander-WebberElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.
Bo HouSchool of Physics and Astronomy, Cardiff University, Cardiff, UK.ORCID 0000-0001-9918-8223
Sung-Min JungElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-8365-7512
Gehan A J AmaratungaElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-8614-2864
Jong Min KimElectrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.ORCID 0000-0002-4241-5154

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Inorganic colloidal quantum dot light-emitting diodes could be used to build next-generation electroluminescent displays due to their colour properties and electrical stability. However, to create high-resolution and large-area displays, a pixel integration method is required, which can deposit quantum dot arrays on an active-matrix backplane and maintain uniformity and precision, without colour cross-contamination. Here we report a cracking-assisted transfer printing technology that can be used to pattern high-resolution full-colour pixel arrays over large areas. The technology uses a controlled cracking process to fracture interparticle cohesive bonds between quantum dots. This facilitates subsequent pick-up and transfer to a thin-film transistor backplane with high precision. With the technology, we achieve pixels down to a size of 600 nm with electroluminescent emission and uniform pixelization over areas up to 4 inches. We create a cadmium-free full-colour active-matrix display with a resolution of 341 pixels per inch, as well as a blue active-matrix display with a flexible form factor. Furthermore, the cracking-assisted transfer printing can improve electroluminescence performance-with higher maximum luminance and operational lifetime than other quantum dot patterning techniques-through precise nano-interface control and high quantum dot packing density.

Indexed as

Design, synthesis and processingDisplaysElectrical and electronic engineeringInorganic LEDsQuantum dots

Identifiers

PMID42780468
PMCPMC13597301

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.