ReviewDiscover nano2026
Nanoimprint lithography for scalable electronic and photonic nanomanufacturing.
Review in Discover nano, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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Who cites it
0 citing papers in PubMed.
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Corrections and comments
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Authors and funding
13 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Nanoimprint lithography (NIL) has emerged as a powerful nanofabrication technology capable of bridging the gap between nanoscale precision and scalable manufacturing. Unlike conventional projection lithography, whose resolution is fundamentally constrained by diffraction and increasingly complex optical systems, NIL relies on direct mechanical replication of nanoscale patterns from a structured mold, enabling deterministic pattern transfer with sub-10 nm resolution. Over the past three decades, NIL has evolved from a laboratory-scale patterning concept into a technologically mature platform with growing industrial relevance across photonics, electronics, and large-area functional materials. This review provides a comprehensive overview of nanoimprint lithography, covering its historical development, technological evolution, material considerations, and emerging applications. By connecting NIL process mechanisms and material constraints with application-specific manufacturing requirements, this review provides a process-to-application perspective on scalable electronic and photonic nanomanufacturing. The fundamental principles and major NIL variants, including thermal NIL (T-NIL), ultraviolet NIL (UV-NIL), step-and-flash (S-FIL)/jet-and-flash (J-FIL) imprint lithography, and roll-to-roll NIL (R2R NIL), are systematically discussed with emphasis on process mechanisms, scalability, and manufacturing compatibility. Critical material considerations such as mold design, imprint resist properties, and substrate compatibility are also analyzed to elucidate the key parameters governing pattern fidelity, residual layer control, and process reliability. Particular attention is devoted to emerging application domains where NIL offers unique advantages, including nanophotonic metasurfaces, integrated silicon photonics, optoelectronic devices, and large-area optical structures. Recent demonstrations of high-efficiency metalenses, low-loss silicon photonic waveguides, and scalable flexible photonic components highlight the ability of NIL to combine subwavelength structural control with wafer-scale replication. As demands for advanced photonic integration and functional nanostructures continue to increase, nanoimprint lithography is increasingly recognized as a scalable manufacturing pathway capable of translating nanoscale device concepts into practical technologies.
Identifiers
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Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.