Evidence map›Paper›PMID 42687877›Full record

ArticleACS applied nano materials2026

Unveiling Buried Air Gaps and Interface Inhomogeneities in van der Waals Stacks via Microreflectance Mapping for Twistoptics Applications.

Julia G Prieto, Adam Roselló, Abel Martínez-Suárez, Enrique Terán-García, Christian Lanza, Yolanda Álvarez, Stephan Kasemann, Stefan Partel, Kenji Watanabe, Takashi Taniguchi and 6 more

Abstract read
In one paragraph

Article in ACS applied nano materials, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

16 authors.

Julia G PrietoDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0002-3705-2336
Adam RosellóDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0009-0002-1587-1565
Abel Martínez-SuárezDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.
Enrique Terán-GarcíaDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0003-3049-1472
Christian LanzaDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.
Yolanda ÁlvarezDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0002-3275-4793
Stephan KasemannResearch Centre for Microtechnology, FHVVorarlberg University of Applied Sciences, Campus V, Hochschulstraße 1, 6850 Dornbirn, Austria.
Stefan PartelResearch Centre for Microtechnology, FHVVorarlberg University of Applied Sciences, Campus V, Hochschulstraße 1, 6850 Dornbirn, Austria.ORCID https://orcid.org/0000-0001-5762-0612
Kenji WatanabeResearch Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.ORCID https://orcid.org/0000-0003-3701-8119
Takashi TaniguchiResearch Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.ORCID https://orcid.org/0000-0002-1467-3105
Adrián Fernández-GavelaDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.
Dimas G de OteyzaNanomaterials and Nanotechnology Research Center (CINN), CSIC-University of Oviedo-Principality of Asturias, Avenida de La Vega 4-6 El Entrego, San Martin Del Rey Aurelio, 33940 Asturias, Spain.ORCID https://orcid.org/0000-0001-8060-6819
Luis Javier MartínezNanomaterials and Nanotechnology Research Center (CINN), CSIC-University of Oviedo-Principality of Asturias, Avenida de La Vega 4-6 El Entrego, San Martin Del Rey Aurelio, 33940 Asturias, Spain.ORCID https://orcid.org/0000-0003-1376-2488
Aitana Tarazaga Martín-LuengoDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0002-3078-4649
Pablo Alonso-GonzálezDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0002-4597-9326
Javier Martín-SánchezDepartment of Physics, University of Oviedo, Oviedo 33006, Spain.ORCID https://orcid.org/0000-0002-6601-9447

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Van der Waals (vdW) heterostructures provide a versatile platform for multifunctional photonic and optoelectronic devices, yet their performance is often limited by interfacial inhomogeneities that perturb the local dielectric environment. This is particularly critical in polaritonic heterostructures, where the near-field optical response is extremely sensitive to buried defects. Here, we present a high-resolution microreflectance mapping technique for assessing interfacial quality in vdW heterostructures and enabling the fabrication of twisted polaritonic stacks. By combining hyperspectral imaging with transfer-matrix-method (TMM) fitting, we determine flake thickness directly on PDMS stamps and quantify buried air gaps and other interfacial nonuniformities in assembled stacks. Using h-BN and α-MoO

Indexed as

h-BNheterostructuresmicroreflectancepolaritonicsvan der Waals materialsα-MoO3

Identifiers

PMID42687877
PMCPMC13532039

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.