ArticleJournal of synchrotron radiation2026
Single-shot third-harmonic spectral diagnostics for tender X-ray FEL pulses using a bent-crystal spectrometer.
Article in Journal of synchrotron radiation, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
The tender X-ray (2.0-4.0 keV) region provides access to the K-edges of light- and mid-Z elements that are central to catalysis, energy materials and soft condensed matter, but direct single-shot spectral diagnostics in this range are technically challenging. Ruled gratings typically offer limited resolving power, while scattering-based approaches suffer from low efficiency in an on-line geometry. We demonstrate that a bent-crystal spectrometer on the SwissFEL Aramis beamline can be adapted to provide indirect single-shot spectral diagnostics for tender X-ray operation by measuring the natural third harmonic of 2.1 and 2.5 keV self-amplified spontaneous emission pulses at 6.3 and 7.5 keV, respectively. The scaled third-harmonic spectra reproduce the bandwidth obtained from independent monochromator scans of the fundamental, yielding a relative bandwidth of ΔE/E ≃ 3.1‰ at 2.5 keV. An autocorrelation analysis of 2400 shots gives an upper limit on the instrumental resolution better than 6 × 10
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