ArticleMicromachines2026
Laser-Enhanced Machine Vision for Edge Profile Measurement of Thin Film Printed Electronics.
Article in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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2 authors.
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Abstract
Thin film printed electronics, such as flexible circuits and sensor sheets, require non-contact inspection to detect defects and edge degradation. The present paper presents a laser-enhanced machine vision framework for detecting and analyzing the edges of printed conductive tracks using Canny edge detection and Otsu thresholding. Using a coherent laser source, Otsu's method enhances contrast at the ink-substrate interface, enabling robust segmentation of edge lines. Canny operator is applied to thresholded images to extract precise edge profiles. Multiple printed tracks are analyzed to calculate four lateral edge roughness values (
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