ArticleSensors (Basel, Switzerland)2026
A Dual-Polarized Narrow-Beam Antenna for Microwave Interrogation of Back-Surface Flaws in Polyethylene Slabs.
Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
In view of the advantage of cross-polarized inspection (CrPI) in microwave nondestructive testing (MNT), in this paper a dual-polarized narrow-beam antenna as the pivotal reflectometric sensor is systematically designed and realized particularly for enhancement of detection and imaging of subsurface defects in dielectric structures. The antenna is equipped with a compact asymmetric waveguide orthomode transducer, with Teflon used as the internal filling material, in an effort to reduce its size and narrow the beamwidth. The internal dimensions of the realized dual-polarized narrow-beam antenna are optimized via numerical simulations. Based on the optimal design parameters, the antenna is fabricated and assessed through experiments. The experimental results reveal that the fabricated antenna has better metric indicators in terms of a return loss better than 10 dB, isolation better than 40 dB in 30.0 GHz~36.0 GHz and half-power beamwidths below 36.9° at 36.0 GHz. In order to further affirm the applicability of the fabricated antenna for CrPI, an MNT system is established to perform two-dimensional scanning and imaging of back-surface volumetric defects in polyethylene specimens. Based on the image characteristics of CrPI, a flaw-recovery algorithm is proposed to retrieve the defect opening profile. The averaged contrast-to-noise ratio of the processed CrPI-based image is found to be approximately five times larger than that of the raw CrPI-based image and fourteen times bigger than that of the raw CoPI-based image. Experimental results have further indicated that the fabricated antenna is feasible for not only co-polarized inspection (CoPI) but for CrPI, which exhibits higher testing sensitivity and defect-image contrast than CoPI. In conjunction with the flaw-recovery algorithm, by utilizing the dual-polarized narrow-beam antenna with the better metric indicators for CrPI, the image quality of the back-surface flaws in polyethylene slabs can be effectively improved.
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