Junction Formation and Leakage Current Suppression in Planar High-Purity Germanium Detectors for Low-Energy X-Ray Detection.

Meng Cao, Qingzhi Hu, Yanggang Jia, Zexin Wang, Zhaoran Guan, Haofei Huang, Linjun Wang, Jian Huang

Abstract read

In one paragraph

Article in Materials (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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5 · Who and what money

Authors and funding

8 authors.

Meng CaoState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Qingzhi HuState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Yanggang JiaState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.ORCID 0009-0002-9044-1418

Zexin WangState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Zhaoran GuanState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Haofei HuangState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Linjun WangState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Jian HuangState Key Laboratory of Materials for Advanced Nuclear Energy & School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China.

Funding

National Key R&D Program of China No. 2023YFA1608703National Natural Science Foundation of China No.12575328

6 · The paper itself

Abstract

This study addresses the need for dark-current control and stable current response in planar high-purity germanium (HPGe) detectors for low-energy X-ray detection. A device fabrication strategy based on the coupled optimization of near-surface treatment, N/P junction formation, and guard-ring electrode design is proposed. Unlike previous studies that mainly focused on contact-layer fabrication, segmented electrode structures, low-noise readout, or response simulation, this work investigates low-damage near-surface construction, N-type and P-type contact-layer formation, and edge-related leakage-current regulation as an interconnected processing route. The relationship among the near-surface state, junction quality, electrode configuration, and edge-related leakage current is emphasized. Chemical mechanical polishing (CMP) reduced the surface roughness Sa of the HPGe crystal to 6.68 nm, providing a low-damage near-surface foundation for subsequent junction fabrication. On this basis, the optimized Li thermal diffusion process, namely 0.5 Å s

Indexed as

high-purity germanium detectorjunction regulationleakage current suppressionX-ray detection

Identifiers

PMID42513744

DOI10.3390/ma19143008

PMCPMC13412493

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