ReviewMolecules (Basel, Switzerland)2026
Residual Stress in Epoxy-Based Insulators: Formation, Detection, and Reliability.
Review in Molecules (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Authors and funding
4 authors.
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Abstract
Gas-insulated switchgears (GISs) and gas-insulated transmission lines (GILs) are essential for large-capacity power transmission in demanding environments, such as high drops, large spans, and heavy pollution. As the core components providing both electrical insulation and mechanical support, ultra-high voltage (UHV) epoxy-based insulators often suffer from high internal residual stress. This issue, compounded by a lack of reliable detection methods, frequently results in equipment being commissioned with hidden defects. To address this, this review first examines the formation mechanisms of curing deformation and residual stress in oversized insulators based on cure kinetics and thermo-chemical coupling models. Subsequently, it provides a comprehensive summary of current residual stress measurement techniques, comparing the applicability and limitations of embedded sensors, direct mechanical measurements, and indirect non-destructive testing (NDT) methods. Finally, by coupling residual stress with filler sedimentation, the stress distribution patterns and mechanical reliability of epoxy-based insulators across different life-cycle stages are analyzed. These insights offer valuable theoretical references for the structural design, process optimization, and performance evaluation of oversized epoxy-based insulators, ultimately contributing to the intrinsic safety of UHV power equipment.
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