ArticleMicromachines2026
The Damage Effects on a HgCdTe Detector of a Short-Infrared Pulsed Laser with Different Pulse Widths.
Article in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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8 authors.
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Abstract
The high sensitivity of HgCdTe infrared detectors makes them highly vulnerable to laser irradiation, yet the influence of pulse width on damage behavior in the short-wave infrared (SWIR) band remains insufficiently understood. In this study, we experimentally and numerically investigate the damage effects of SWIR pulsed lasers on HgCdTe focal plane array detectors, focusing on the role of pulse width. Three lasers with pulse widths of 5.5 ns, 0.6 ms and 2 ms are used to irradiate the detector, and the damage thresholds for spot damage, line damage, and complete failure are measured. Damage morphologies are characterized by optical microscopy and scanning electron microscopy. A finite-element thermal model is also established to calculate transient temperature distributions and theoretical damage thresholds. For the 0.6 ms pulse, the measured thresholds for spot damage, line damage, and complete failure are 5.7 J/cm
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