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ArticleSmall (Weinheim an der Bergstrasse, Germany)2026

Photoelectron Spectroscopic Insights Into Interfacial Silicide Formation and Electronic Coupling Governing Contact Resistance Reduction at Mo/SiC Interfaces.

Xiangrui Geng et al.PubMed ↗Full text ↗Publisher ↗

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Full record →Abstract, authors, funding and every citing paper · PMID 42473084