Evidence map›Paper›PMID 42467542›Full record

ArticleJournal of synchrotron radiation2026

A beam-direction cross-vessel metrology method and error analysis for the ptychography setup at HEPS ID09.

Ruiying Liao, Zina Ou, Haihan Yu, Xuan Wang, Jie Dong, Aiyu Zhou, Wenkai Kang, Liang Zhou, Shanzhi Tang, Ming Li and 1 more

Abstract read
In one paragraph

Article in Journal of synchrotron radiation, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Ruiying LiaoMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.ORCID 0000-0001-9572-5984
Zina OuMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.ORCID 0009-0004-4191-4703
Haihan YuMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.ORCID 0009-0009-3696-2002
Xuan WangMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.
Jie DongMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.
Aiyu ZhouMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.
Wenkai KangMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.
Liang ZhouMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.
Shanzhi TangMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.ORCID 0000-0002-1935-0356
Ming LiMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.ORCID 0000-0002-8044-6074
Weifan ShengMultidisciplinary Research Center, Institute of High Energy Physics of the Chinese Academy of Sciences, Beijing, People's Republic of China.

Funding

High Energy Photon Source 2017-000052-73-01-001294University of Science and Technology of China E590YHHD
6 · The paper itself

Abstract

A metrology method dedicated to position monitoring and correction for the ptychography setup at the High Energy Photon Source (HEPS, Beijing, China) beamline ID09 is proposed. The sophisticated design of the Invar interferometer metrology frame ensures optimal performance within the compact environment between the focal spot and the sample setup. The measurement method and error analysis are described in detail. The sample setup achieves a positional stability of less than 2 nm RMS from 1 Hz to 500 Hz. The 12.3 nm reconstruction resolution of 2D ptychography at 12.4 keV demonstrates that the interferometer metrology strategy is available.

Indexed as

error analysisinterferometersmetrology methodptychography setup

Identifiers

PMID42467542
PMCPMC13549338

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.