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ArticleMaterials (Basel, Switzerland)2026

Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy.

Jun Li et al.PubMed ↗Full text ↗Publisher ↗

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Full record →Abstract, authors, funding and every citing paper · PMID 42451904