ArticleSensors (Basel, Switzerland)2026
Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection.
Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Metallic probe carriers are commonly used in magnetic flux leakage (MFL) inspection to support sensing elements and maintain lift-off, but a conductive carrier located near the sensor can act as an active electromagnetic boundary. This study investigates the carrier-induced waveform reconstruction caused by such a conductive near-field boundary. A theoretical model is developed to describe the induced current, secondary magnetic field, and relaxation-related downstream memory generated when the carrier moves through a non-uniform leakage field. Transient finite-element simulations are used to examine the effects of carrier material, scanning speed, and concave carrier geometry. Compared with the air reference, aluminum and copper carriers produce stage-dependent waveform reconstruction, including valley modification, peak modulation, feature-position shift, and trailing-side extension. The quantitative waveform-deviation indicators increase with increasing speed and are further regulated by carrier geometry. Experimental results based on repeated magnetic response events confirm amplitude suppression, non-zero residual after amplitude matching, response broadening, and enhanced trailing asymmetry. These results demonstrate that the metallic probe carrier is not an electromagnetically transparent holder but an active near-field conductive boundary that should be considered in probe-carrier design and MFL signal interpretation.
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