Evidence map›Paper›PMID 42436113›Full record

ArticleNature communications2026

Wafer-scale 2D MoS

Ziming Wang, Anhan Liu, Hengbin Ding, Fan Wu, Caifang Gao, Yizhe Guo, Ruifang Xue, Peigen Zhang, Yanming Liu, Tao Deng and 2 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nature communications, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Ziming Wang *School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.ORCID http://orcid.org/0009-0004-3673-0934
Anhan Liu *School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Hengbin Ding *School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Fan Wu *School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Caifang Gao *School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Yizhe GuoSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.ORCID http://orcid.org/0000-0002-0761-027X
Ruifang XueSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Peigen ZhangSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.ORCID http://orcid.org/0009-0005-2814-7658
Yanming LiuSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China.
Tao DengSchool of Electronic and Information Engineering, Beijing Jiaotong University, Beijing, China. dengtao@bjtu.edu.cn.ORCID http://orcid.org/0000-0001-9597-4833
Tian-Ling RenSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China. RenTL@tsinghua.edu.cn.ORCID http://orcid.org/0000-0002-7330-0544
He TianSchool of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China. tianhe88@tsinghua.edu.cn.ORCID http://orcid.org/0000-0001-7328-2182

Funding

National Natural Science Foundation of China (National Science Foundation of China) 62405159
6 · The paper itself

Abstract

As conventional silicon scaling approaches fundamental physical limits, two-dimensional semiconductors offer a promising pathway for continued transistor miniaturization. Here we show an ultra-scaled vertical MoS

Identifiers

PMID42436113
PMCPMC13483455

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.