Evidence map›Paper›PMID 42434471›Full record

ArticleACS materials Au2026

Low-Power Sputtered Cu

María Del Pilar Aguilar-Del-Valle, Ana Laura Pérez-Martínez, Angélica Carrillo-Verduzco, Jesús Rafael González-Parra, Alejandra López-Suárez, Luis Fernando Garrido-García, José Reyes-Gasga, Arturo Rodríguez-Gómez

Abstract read
In one paragraph

Article in ACS materials Au, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

María Del Pilar Aguilar-Del-ValleFacultad de Ingeniería, DCB, Universidad Nacional Autónoma de México, Ciudad Universitaria, Coyoacán, Ciudad de México 04510, México.ORCID https://orcid.org/0000-0002-1577-4207
Ana Laura Pérez-MartínezFacultad de Ingeniería, DCB, Universidad Nacional Autónoma de México, Ciudad Universitaria, Coyoacán, Ciudad de México 04510, México.ORCID https://orcid.org/0000-0002-7592-6591
Angélica Carrillo-VerduzcoInstituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Ciudad Universitaria, A.P. 70-360, Coyoacán, Ciudad de México 04510, México.ORCID https://orcid.org/0000-0001-5437-2780
Jesús Rafael González-ParraCentro de Ingeniería de Superficies y Acabados, Facultad de Ingeniería, Universidad Nacional Autónoma de México, Ciudad Universitaria, Coyoacán, Ciudad de México 04510, México.
Alejandra López-SuárezInstituto de Física, Universidad Nacional Autónoma de México, Circuito de la Investigación Científica s/n, Ciudad Universitaria,A.P. 20-364, Coyoacán, Ciudad de México 04510, México.
Luis Fernando Garrido-GarcíaInstituto de Física, Universidad Nacional Autónoma de México, Circuito de la Investigación Científica s/n, Ciudad Universitaria,A.P. 20-364, Coyoacán, Ciudad de México 04510, México.
José Reyes-GasgaInstituto de Física, Universidad Nacional Autónoma de México, Circuito de la Investigación Científica s/n, Ciudad Universitaria,A.P. 20-364, Coyoacán, Ciudad de México 04510, México.ORCID https://orcid.org/0000-0002-9918-6196
Arturo Rodríguez-GómezInstituto de Física, Universidad Nacional Autónoma de México, Circuito de la Investigación Científica s/n, Ciudad Universitaria,A.P. 20-364, Coyoacán, Ciudad de México 04510, México.ORCID https://orcid.org/0000-0003-1331-8598

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Developing stable copper-based transparent oxide semiconductors (TOSs) remains a scientific challenge, particularly via scalable processes that enable straightforward tuning of optical absorption, sheet resistance, and carrier type (p- vs n-type). Here we present a simple and reproducible methodology combining direct current (DC) sputtering and a thermal treatment to fabricate n-type copper-oxide TOS thin films. Ultrathin Cu layers deposited at 20 W in air and grown for 2-6 s on fused silica were converted by short-time annealing at 400 °C to single-phase Cu

Indexed as

Copper OxideDC Sputteringn-type Transparent Thin FilmsOptoelectronic devicesOxygen vacanciesTransparent Oxide Semiconductors

Identifiers

PMID42434471
PMCPMC13352278

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.