Evidence map›Paper›PMID 42431886›Full record

ArticleNature communications2026

Coherent transformation of metal halide perovskites.

Pinghui Yang, Haokun Shi, Zhen Wang, Shuaijun Yan, Xiliu Wang, Bo Xu, Junbo Wang, Kaidi Liu, Xuan Gao, Wenbo Liu and 5 more

Abstract read
In one paragraph

Article in Nature communications, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

15 authors.

Pinghui Yang *Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Haokun Shi *Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Zhen Wang *Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Shuaijun YanKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Xiliu WangKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Bo XuKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Junbo WangKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Kaidi LiuKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Xuan GaoKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Wenbo LiuKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.
Fangfang WangKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.ORCID http://orcid.org/0000-0002-5441-4490
Lin ZhuKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China.ORCID http://orcid.org/0000-0001-7490-4182
Renzhi LiKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China. iamrzli@njtech.edu.cn.ORCID http://orcid.org/0009-0004-6212-0283
Wei HuangKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China. vc@nwpu.edu.cn.ORCID http://orcid.org/0000-0001-7004-6408
Jianpu WangKey Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (Nanjing Tech), Nanjing, 210003, Jiangsu, China. iamjpwang@njtech.edu.cn.ORCID http://orcid.org/0000-0002-2158-8689

Funding

National Natural Science Foundation of China (National Science Foundation of China) 62288102
6 · The paper itself

Abstract

Metal-halide perovskites offer high optoelectronic performance but translating laboratory efficiencies into controllable, reproducible processes remains challenging. Perovskite crystallization is tracked by in situ multiwavelength absorption to show that coherent, layer-by-layer conversion of low-n intermediates to three-dimensional perovskite, quantified by a transformation index (TI), correlates with device quality. TI displays a Sabatier-type dependence on additive-precursor interaction strength and concentration, defining an engineering window for reproducible film formation. Within this window, post-treatment-free devices reach a champion power conversion efficiency of 26.40% with improved stability and reduced device scatter at laboratory scale. TI is extractable from an inline optical readout and provides a measurable metric for additive screening and process tuning. Its applicability to scalable deposition is further validated through slot-die coated mini-modules, offering a practical pathway for inline process control.

Identifiers

PMID42431886
PMCPMC13482151

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.