Evidence map›Paper›PMID 42427179›Full record

ArticleSmall methods2026

Interfacial and Kinetic Limitations in Alkaline OER: A Case Study of Electronic Modifications Using Fe in CuO Lattice.

Suresh Chandra Baral, Dilip Sasmal, Manju Kumari, Rakhi Saha, Sayak Datta, Mange Ram, Krishna Kanta Haldar, A Mekki, K Harrabi, Sudhagar Pitchaimuthu and 1 more

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Article in Small methods, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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2 · The registry

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4 · The record

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5 · Who and what money

Authors and funding

11 authors.

Suresh Chandra BaralDepartment of Physics, Indian Institute of Technology Indore, Indore, India.ORCID https://orcid.org/0000-0003-1995-1650
Dilip SasmalDepartment of Physics, Indian Institute of Technology Indore, Indore, India.
Manju KumariDepartment of Physics, Indian Institute of Technology Indore, Indore, India.
Rakhi SahaDepartment of Physics, Indian Institute of Technology Indore, Indore, India.
Sayak DattaDepartment of Metallurgical Engineering and Material Science, Indian Institute of Technology Bombay, Mumbai, India.
Mange RamDepartment of Chemistry, Central University of Punjab, Bathinda, India.
Krishna Kanta HaldarDepartment of Chemistry, Central University of Punjab, Bathinda, India.ORCID https://orcid.org/0000-0002-0675-8299
A MekkiDepartment of Physics, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia.
K HarrabiDepartment of Physics, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia.
Sudhagar PitchaimuthuResearch Centre for Carbon Solutions (RCCS), Institute of Mechanical, Process and Energy Engineering, School of Engineering and Physical Sciences, Riccarton Campus, Heriot-Watt University, Edinburgh, Scotland, UK.
Somaditya SenDepartment of Physics, Indian Institute of Technology Indore, Indore, India.

Funding

Department of Science and Technology (DST), Government of India DST/TDT/AMT/2017/200DST, Government of India SR/FST/PSI-225/2016DST INSPIRE, Govt. of India IF190617Prime Minister's Research Fellowship 2102739University Grant Commission (UGC), Govt. of India 211610017185University Grant Commission (UGC), Govt. of India 211610074937
6 · The paper itself

Abstract

Identifying the dominant kinetic bottlenecks in the oxygen evolution reaction (OER) is essential for the rational design of efficient electrocatalysts. Chemical modifications can alter the electronic charge distribution, thereby altering interfacial and surface reaction kinetics. CuO, a semiconducting oxide with localized charge transport and moderate conductivity, serves as an ideal platform for investigating kinetic processes. Fe doping can effectively tune the electronic structure and interfacial charge-transfer kinetics while largely preserving the intrinsic CuO crystal lattice. Density Functional Theory (DFT) calculations reveal that Fe incorporation introduces electronic states near the Fermi level, lowering the work function and facilitating charge transfer, while simultaneously stabilizing oxygenated intermediates at higher Fe concentrations. A promoter-inhibitor crossover, linking electronic structure to kinetic evolution, is analyzed from competing processes identified from a combined investigation using Electrochemical Impedance Spectroscopy (EIS) and Distribution of Relaxation Times (DRT) analysis. Three distinct processes associated with interfacial charge transfer and surface-reaction kinetics are detected. Moderate Fe substitution reduces interfacial resistance and lowers the OER overpotential, whereas higher Fe content increases kinetic resistance, indicating a transition toward surface-reaction-limited behavior. Hence, from DFT, EIS, and DRT, this work provides a mechanistic framework for disentangling interfacial and surface-reaction contributions in semiconducting electrocatalysts.

Indexed as

density functional theorydistribution of relaxation timeselectrocatalystselectrochemical impedance spectroscopyinterfacial charge transferoxygen evolution reactionsurface‐reaction kinetics

Identifiers

PMID42427179
PMCPMC13450351

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