Evidence map›Paper›PMID 42412370›Full record

ArticleNano convergence2026

Healing effect of high-energy proton irradiation on the reliability of HfZrO based high-k dielectrics.

Chan Bin Lee, Useok Choi, Yongsu Lee, Jun-Hyeok Choi, Hyeon-Seok Shin, Uigwan Shin, Byeong Gwan Kim, Jun Yeong Hong, Jae Min Jo, Jeong Min Park and 3 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nano convergence, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Chan Bin LeeDepartment of Electrical Engineering, Center for Semiconductor Technology Convergence (CSTC), Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Useok ChoiCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Yongsu LeeAdvanced Radiation Technology Institute, Korea Atomic Energy Research Institute (KAERI), 29 Geumgu-Gil, Jeongeup-Si, Jeolabuk-Do, 56212, Republic of Korea.
Jun-Hyeok ChoiCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Hyeon-Seok ShinDepartment of Electrical Engineering, Center for Semiconductor Technology Convergence (CSTC), Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Uigwan ShinCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Byeong Gwan KimCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Jun Yeong HongCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Jae Min JoCenter for Semiconductor Technology Convergence (CSTC), Graduate School of Semiconductor Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea.
Jeong Min ParkAdvanced Radiation Technology Institute, Korea Atomic Energy Research Institute (KAERI), 29 Geumgu-Gil, Jeongeup-Si, Jeolabuk-Do, 56212, Republic of Korea.
Hyeon Jun HwangDepartment of Semiconductor Engineering, Mokpo National University, 1666, Yeongsan-Ro, Cheonggye-Myeon, Muan-Gun, Jeolanam-Do, 58554, Republic of Korea.
Chang Goo KangAdvanced Radiation Technology Institute, Korea Atomic Energy Research Institute (KAERI), 29 Geumgu-Gil, Jeongeup-Si, Jeolabuk-Do, 56212, Republic of Korea.
Byoung Hun LeeDepartment of Electrical Engineering, Center for Semiconductor Technology Convergence (CSTC), Pohang University of Science and Technology, Cheongam-Ro 77, Nam-Gu, Pohang, Gyeongbuk-Do, 37673, Republic of Korea. bhlee1@postech.ac.kr.ORCID http://orcid.org/0000-0002-4540-7731

Funding

National Research Foundation of Korea RS-2025-02315930National Research Foundation of Korea RS-2025-25410048
6 · The paper itself

Abstract

This study investigates the impact of high-energy proton irradiation (33 and 100 MeV) on the radiation response and statistical uniformity of the breakdown field of Hf

Indexed as

HfxZr1−xO2Proton irradiationRadiation hardeningReliabilityTime zero dielectric breakdown

Identifiers

PMID42412370
PMCPMC13342009

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.