Microwave Near Field Imaging of Externally Injected Signals in an Encapsulated Electronic Device.

Qiang Zhu, Yangfan Zhang, Xin Li, Huanfei Wen, Jun Tang, Jun Liu

Abstract read

In one paragraph

Article in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it

0cells of the map it votes in

0citing papers in PubMed

–field-weighted citation impact

1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Qiang ZhuState Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China.

Yangfan ZhangState Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China.

Xin LiState Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instrument, North University of China, Taiyuan 030051, China.

Huanfei WenScience and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.ORCID 0000-0002-2972-9669

Jun TangState Key Laboratory of Widegap Semiconductor Optoelectronic Materials and Technologies, North University of China, Taiyuan 030051, China.

Jun LiuState Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instrument, North University of China, Taiyuan 030051, China.

Funding

the Shanxi Provincial Natural Science Research General Program 202503021211125

6 · The paper itself

Abstract

Addressing the challenges of electromagnetic compatibility testing and non-destructive inspection of internal structures in miniaturized electronic devices. This paper reports a non-destructive testing method based on wide-field imaging using diamond nitrogen-vacancy (NV) centers, and systematically demonstrates its application on a black-epoxy-encapsulated Universal Serial Bus (USB) flash drive. In the experiment, a swept microwave signal from 2.82 GHz to 2.97 GHz was sequentially injected into the four external interface pins of the USB drive. A bulk diamond served as the quantum sensing layer, and optically detected magnetic resonance (ODMR) was employed to perform wide-field imaging of the microwave field distribution on the surface of the signal lines within a 1 × 1 mm

Indexed as

non-destructive testingNV centerquantum sensorUSB flash drive

Identifiers

PMID42354741

DOI10.3390/mi17060711

PMCPMC13302771

What OpenQuestion holds

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LicenceCC BY

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.