Evidence map›Paper›PMID 42334153›Full record

ArticleACS applied materials & interfaces2026

Polarity-Dependent Charge Transport and Resistance Degradation Enabled by Oxygen-Vacancy Gradients in BiFeO

Sengsavang Aphayvong, Abhyuday Verma, Kae Nakamura, Ali Habib Akhyari, Takeshi Yoshimura, Susan Trolier-McKinstry, Betul Akkopru-Akgun

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in ACS applied materials & interfaces, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Sengsavang AphayvongDepartment of Physics and Electronics Engineering, Osaka Metropolitan University, Sakai-Shi, Osaka 599-8531, Japan.ORCID 0009-0002-0651-3723
Abhyuday VermaDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.
Kae NakamuraDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.ORCID 0009-0007-2926-5415
Ali Habib AkhyariDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.
Takeshi YoshimuraDepartment of Physics and Electronics Engineering, Osaka Metropolitan University, Sakai-Shi, Osaka 599-8531, Japan.ORCID 0000-0002-7147-4225
Susan Trolier-McKinstryDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.
Betul Akkopru-AkgunDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The long-term reliability of Mn-doped BiFeO

Indexed as

conduction mechanismelectrical degradationMn-doped BiFeO3oxygen vacancy gradientpiezoelectric MEMSreliability

Identifiers

PMID42334153
PMCPMC13352513

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.