Evidence map›Paper›PMID 42310112›Full record

ArticleNature2026

Probing picometre-scale interlayer deformations via hyperbolic polaritons.

Shu Zhang, Xiangdong Guo, Xiaowen Zhang, Jiashu Yang, Qinzheng Yu, Zhengyang Mou, Bingze Wu, Chenchen Wu, Shiyu Yang, Yongxin Lan and 13 more

Abstract read
PubMed Publisher
In one paragraph

Article in Nature, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

23 authors.

Shu Zhang *Laboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.
Xiangdong Guo *Institute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.ORCID http://orcid.org/0009-0006-2492-8497
Xiaowen Zhang *International Center for Quantum Materials, Electron Microscopy Laboratory, School of Physics, Academy for Advanced Interdisciplinary Studies, Interdisciplinary Institute of Light-Element Quantum Materials and Research Center for Light-Element Advanced Materials, Peking University, Beijing, China.
Jiashu Yang *Suzhou Laboratory, Suzhou, China.
Qinzheng YuLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.
Zhengyang MouLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.
Bingze WuInstitute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.
Chenchen WuLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.ORCID http://orcid.org/0000-0002-6534-1696
Shiyu YangLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.
Yongxin LanInstitute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.
Peiyi HeInternational Center for Quantum Materials, Electron Microscopy Laboratory, School of Physics, Academy for Advanced Interdisciplinary Studies, Interdisciplinary Institute of Light-Element Quantum Materials and Research Center for Light-Element Advanced Materials, Peking University, Beijing, China.
Jing ShiInstitute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.
Kaijun FengInstitute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.
Yuxiang GaoState Key Laboratory of Superhard Materials, Synergetic Extreme Condition User Facility, College of Physics, Jilin University, Changchun, China.
Qiang ZhengLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China.ORCID http://orcid.org/0000-0002-9279-7779
Shuang ZhangNew Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.ORCID http://orcid.org/0000-0003-4556-2333
F Javier García de AbajoICFO - Institut de Ciencies Fotoniques, Barcelona Institute of Science and Technology, Castelldefels, Spain.
Zhipei SunQTF Centre of Excellence, Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland.ORCID http://orcid.org/0000-0002-9771-5293
Mingguang YaoState Key Laboratory of Superhard Materials, Synergetic Extreme Condition User Facility, College of Physics, Jilin University, Changchun, China.ORCID http://orcid.org/0000-0002-1297-5679
Feng DingSuzhou Laboratory, Suzhou, China. dingf@szlab.ac.cn.ORCID http://orcid.org/0000-0001-9153-9279
Peng GaoInternational Center for Quantum Materials, Electron Microscopy Laboratory, School of Physics, Academy for Advanced Interdisciplinary Studies, Interdisciplinary Institute of Light-Element Quantum Materials and Research Center for Light-Element Advanced Materials, Peking University, Beijing, China. pgao@pku.edu.cn.ORCID http://orcid.org/0000-0001-9868-2115
Xiaoxia YangLaboratory of Nanophotonic Materials and Devices, Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China. yangxx@nanoctr.cn.ORCID http://orcid.org/0000-0002-0670-053X
Qing DaiInstitute of Information Functional Materials, Shanghai Key Laboratory of Atomic-Level Intelligent Manufacturing of Materials and Devices, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China. daiqing@sjtu.edu.cn.ORCID http://orcid.org/0000-0002-1750-0867

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The resilience of van der Waals (vdW) materials to large strain fields makes them an ideal platform for tuning electronic, optical and magnetic properties

Identifiers

PMID42310112

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.