Evidence map›Paper›PMID 42280026›Full record

ArticleMaterials (Basel, Switzerland)2026

Formation Mechanism and Dielectric Properties of Ultra-High-Voltage Anodic Al Foils Investigated by ReaxFF-MD and DFT.

Xuliang Chu, Yucheng Ji, Chenyang Yao, Jinlong Wu, Xiaoxue Song, Xiaoou Liu, Hongliang Li, Xin Wang, Wenfeng Yang, Junsheng Wu and 1 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Materials (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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1 · What the graph read from it

What it found

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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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3 · Its place in the literature

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0 citing papers in PubMed.

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4 · The record

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5 · Who and what money

Authors and funding

11 authors.

Xuliang ChuNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Yucheng JiNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Chenyang YaoNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Jinlong WuNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Xiaoxue SongNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Xiaoou LiuNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Hongliang LiXinjiang Joinworld Co., Ltd., Urumqi 830013, China.
Xin WangXinjiang Joinworld Co., Ltd., Urumqi 830013, China.
Wenfeng YangNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
Junsheng WuNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.ORCID 0000-0002-8485-0816
Chaofang DongNational Materials Corrosion and Protection Data Center, Institute for Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.

Funding

the Basic Research Project JSHS2020209B001the Basic Research Project JSHS2023209C001-1the National Key Research and Development Program of China No.2024YFB3411500the National Natural Science Foundation of China No.52125102the National Natural Science Foundation of China No.52501077the Shihezi Municipal Science and Technology Project Grant No. 2024ZD02the Young Elite Scientists Sponsorship Program by CAST YESS20240240
6 · The paper itself

Abstract

Understanding the atomic-scale formation of anodic oxide films is critical for Al electrolytic capacitors. The formation mechanism and dielectric properties of an ultra-high-voltage anodized Al foil were investigated by combining experiments, reactive molecular dynamics, and first-principles calculations. Results indicate that film growth is primarily governed by the (011) crystal plane, and the density of the oxide film increases with the applied electric field. The diffusion barrier of H atoms (0.54 eV) is significantly lower than that of O atoms (1.41 eV), suggesting the preferential formation of Al hydroxide oxide species on the surface. As the anodization voltage increases, the oxide undergoes phase evolution from AlOOH to γ-Al

Indexed as

dielectric filmfirst-principles calculationmolecular dynamics simulationultra-high-voltage anodized foil

Identifiers

PMID42280026
PMCPMC13258237

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