Application of Machine Learning in Predicting the Properties of Two-Dimensional Semiconductor Materials.

The rapid evolution of next-generation electronics urgently demands high-performance functional materials. Two-dimensional (2D) semiconductors, characterized by tunable bandgaps, magnetic properties, and excellent optical and electronic properties, hold significant potential for applications in nanoelectronic devices, magnetic storage, and optoelectronics. However, the high computational cost of traditional Density Functional Theory (DFT) severely restricts large-scale high-throughput screening. Meanwhile, problems such as insufficient datasets and non-uniform data quality remain prevalent. Against this background, machine learning (ML), which captures intricate nonlinear correlations and accelerates the discovery of novel materials, has emerged as an efficient technical approach. This review systematically summarizes recent advances in ML-driven property prediction for 2D semiconductors. It first elaborates the fundamental properties and classifications of 2D semiconductors, and then compares traditional computational simulations with ML algorithms, clarifying the distinct advantages of data-driven approaches. Subsequently, this work focuses on the latest progress in predicting critical properties, including bandgap, magnetism, and other physical characteristics. For bandgap prediction, classical algorithms such as random forests are compared with deep learning models represented by graph neural networks. The results demonstrate that deep learning performs much better in low-data regimes and complex material systems. For magnetic property prediction, the impact of feature engineering strategies on model accuracy and efficiency is systematically analyzed. In addition, the research progress of other physical property prediction tasks is briefly summarized. Finally, future research directions for machine learning, including standardized materials databases, physics-informed machine learning, multimodal modeling, and the integration of machine learning with experimental and theoretical methods, are outlined to address challenges in data quality, model interpretability, and cross-system generalization ability. This work aims to provide a systematic theoretical foundation and methodological guidance for research on two-dimensional semiconductor materials assisted by machine learning.