Evidence map›Paper›PMID 42270623›Full record

ArticleNature communications2026

Nanometre-precision terahertz interferometry for battery electrode metrology.

Guseon Kang, Jaeyoon Kim, Mee-Ree Kim, Younggeun Lee, Dong-Chel Shin, Jinwoo Jeon, Hyeonwoo Kim, Dae Hee Kim, Joohyung Lee, Sangbaek Park and 1 more

Abstract read
In one paragraph

Article in Nature communications, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Guseon KangDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Jaeyoon KimDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Mee-Ree KimDepartment of Materials Science and Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.
Younggeun LeeDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Dong-Chel ShinDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.ORCID http://orcid.org/0000-0002-5255-676X
Jinwoo JeonDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.ORCID http://orcid.org/0009-0005-3907-7691
Hyeonwoo KimDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Dae Hee KimDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
Joohyung LeeDepartment of Mechanical System Design Engineering, Seoul National University of Science and Technology (SEOULTECH), Seoul, Republic of Korea.
Sangbaek ParkDepartment of Materials Science and Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.ORCID http://orcid.org/0000-0002-4900-2010
Young-Jin KimDepartment of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. yj.kim@kaist.ac.kr.ORCID http://orcid.org/0000-0002-4271-5771

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

High-precision, non-destructive thickness measurement is essential for lithium-ion battery (LIB) manufacturing. Existing approaches, such as X-rays, acoustic waves, and optical lasers, are limited by speed, resolution, or penetration into conductive materials. Here, we demonstrate nanometre-precision thickness measurements of LIB electrodes using terahertz (THz) Fabry-Pérot (FP) interferometry referenced to a photonic frequency comb. Combining the comb's SI-traceable frequency accuracy with THz radiation's immunity to scattering and absorption, our system directly detects FP modes with sub-10 MHz precision at sweep rates exceeding 12 THz/s, while spectral analysis simultaneously yields the complex refractive index. Electrode thicknesses of 50-150 μm are measured with nanometre precision: 70.1 nm (anode) and 465.5 nm (cathode) at 0.2 s, improving to 7.8 nm and 25.2 nm at 25.6 s, representing a one-to-two orders of magnitude improvement over temporal-analysis methods. The system further supports 3D profiling and dynamic thickness monitoring, enabling a unified, calibration-free platform for next-generation LIB metrology.

Identifiers

PMID42270623
PMCPMC13402754

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.