Evidence map›Paper›PMID 42123835›Full record

ArticleMolecules (Basel, Switzerland)2026

Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV-Vis-NIR Transmittance Spectrum.

Dorian Minkov, George Angelov, Dimitar Nikolov, Rostislav Rusev, Eduardo Blanco, Susana Fernandez, Manuel Ballester, Emilio Marquez

Abstract read
In one paragraph

Article in Molecules (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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0citing papers in PubMed
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1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

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Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Dorian MinkovScientific Research Section (NIS), Technical University, 1000 Sofia, Bulgaria.ORCID 0000-0003-1190-2598
George AngelovDepartment of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.ORCID 0000-0001-7602-3960
Dimitar NikolovDepartment of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.ORCID 0000-0002-2427-2583
Rostislav RusevDepartment of Technology and Management of Communication Systems, Faculty of Telecommunications, Technical University, 1000 Sofia, Bulgaria.
Eduardo BlancoDepartment of Condensed-Matter Physics, Faculty of Science, University of Cadiz, Puerto Real, 11510 Cadiz, Spain.ORCID 0000-0002-2234-1477
Susana FernandezPhotovoltaic Solar Energy Unit, Centre for Energy, Environmental and Technological Research (CIEMAT), Avenida Complutense 40, 28040 Madrid, Spain.ORCID 0000-0003-4264-9767
Manuel BallesterComputer Science Department, Northwestern University, Evanston, IL 60208, USA.ORCID 0000-0001-9135-6421
Emilio MarquezDepartment of Condensed-Matter Physics, Faculty of Science, University of Cadiz, Puerto Real, 11510 Cadiz, Spain.

Funding

European Regional Development Fund BG16RFPR002‑1.014‑0006European Regional Development Fund BG-RRP-2.004-0005
6 · The paper itself

Abstract

While both Urbach tails and dangling bonds are known to be present in a-Si films, the current literature lacks parametrization that simultaneously accounts for both types of defects using only transmittance spectra, reflectance spectra, or spectroscopic ellipsometry. To address this issue, we performed parametrizations of three magnetron-sputtered a-Si thin films deposited on glass substrates at different low pressures of argon gas, using only their measured UV-Vis-NIR transmittance spectra

Indexed as

amorphous Si filmsband tailsdangling bondsdensity of states (DOS)dielectric functionelectron transitionsjoint density of states (JDOS)parametrization of thin filmsspectroscopyUV–Vis–NIR transmittance spectrum

Identifiers

PMID42123835
PMCPMC13164686

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.