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ArticleNanomaterials (Basel, Switzerland)2026

High-Accuracy Characterization of a Single Thin Film on a Substrate from One Transmittance Spectrum by an Advanced Envelope Method Addressing Voids, Tail Electron Transitions, and Deep-Level Electron Transitions in a-Si Films.

Dorian Minkov et al.PubMed ↗Full text ↗Publisher ↗

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High-Accuracy Characterization of a Single Thin Film on a Substrate from One Transmittance Spectrum by an Advanced Envelope Method Addressing Voids, Tail Electron Transitions, and Deep-Level Electron Transitions in a-Si Films. | OpenQuestion