Evidence map›Paper›PMID 42115677›Full record

ArticleScientific reports2026

Single molecule magnet bridging along exposed sidewalls of metal insulator semiconductor diodes for molecularly modified tunneling studies.

Pius Kika Suh, Babu Ram Sankhi, Carlos Rojas-Dotti, José Martínez-Lillo, Pawan Tyagi

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Article in Scientific reports, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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1 · What the graph read from it

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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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3 · Its place in the literature

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4 · The record

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5 · Who and what money

Authors and funding

5 authors.

Pius Kika SuhCenter for Nanotechnology Research and Education, Department of Mechanical Engineering, University of the District of Columbia, Washington DC, 20008, USA. pius.suh@udc.edu.
Babu Ram SankhiCenter for Nanotechnology Research and Education, Department of Mechanical Engineering, University of the District of Columbia, Washington DC, 20008, USA.
Carlos Rojas-DottiDepartamento de Química Inorgànica, Instituto de Ciencia Molecular (ICMol), University of Valencia, Blasco Ibanez Boulevard, Valencia, 46010, Spain.
José Martínez-LilloDepartamento de Química Inorgànica, Instituto de Ciencia Molecular (ICMol), University of Valencia, Blasco Ibanez Boulevard, Valencia, 46010, Spain.
Pawan TyagiCenter for Nanotechnology Research and Education, Department of Mechanical Engineering, University of the District of Columbia, Washington DC, 20008, USA.

Funding

National Science Foundation NSF-MRI grant 1920097
6 · The paper itself

Abstract

Single Molecule Magnets (SMMs) are promising for molecular spintronics owing to their quantum properties; however, reproducible integration into devices has remained challenging due to limitations of break-junction and gold-based systems. This study introduces a scalable NiFe/AlOx/p-Si Metal Insulator Semiconductor (MIS) platform that enables sidewall integration of lipoic acid-functionalized Mn₆ SMMs in a configuration consistent with sulfur-based molecular anchoring at exposed junction edges. Despite fabrication-related variability in pristine MIS junctions, molecular integration produced more convergent reproducible tunneling characteristics across multiple devices, as confirmed by standard deviation analysis. Importantly, charge transport in this architecture remains fundamentally governed by tunneling across the MIS barrier. Molecular integration does not replace intrinsic MIS transport but is associated with modification of interfacial electrostatics, electrode work function, and effective tunneling barrier properties, resulting in improved reproducibility of measured tunneling characteristics across devices. Kelvin Probe Force Microscopy (KPFM) revealed an approximately 0.4 V increase in NiFe surface potential following SMM attachment, providing electrode-level evidence of interfacial electronic modification following molecular treatment. Conceptual modeling suggests two cooperative mechanisms: (i) molecule-induced modification of tunneling barrier electrostatics, quantitatively supported by Brinkman model analysis, and (ii) charge redistribution at the NiFe/SMM interface, which modifies electrode work function and electrostatic boundary conditions of the MIS junction. While direct spectroscopic identification of specific molecular orbitals such as the Lowest Unoccupied Molecular Orbital (LUMO) was not performed, the observed conductance enhancement, tunneling barrier modification, and surface potential shift strongly support molecule-induced modulation of the MIS tunneling barrier through interfacial electronic coupling and associated electrostatic barrier modulation. The present conclusions are limited to the specific case of lipoic acid-functionalized Mn₆ SMMs and should be interpreted as a system-specific demonstration rather than a universal statement for all molecularly modified MIS junctions.

Identifiers

PMID42115677
PMCPMC13351018

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