Evidence map›Paper›PMID 42076235›Full record

ArticleMicromachines2026

Design and Implementation of High-Capacity DDR3 Micro-Module Based on 3D TSV Advanced Packaging.

Haoyue Ji, Liang Zeng, Hongwen Qian, Wenchao Tian, Jingjing Lin, Yuhe Duan

Abstract read
In one paragraph

Article in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Haoyue JiSchool of Electro-Mechnical Engineering, Xidian University, Xi'an 710071, China.
Liang ZengThe 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214062, China.
Hongwen QianThe 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214062, China.
Wenchao TianSchool of Electro-Mechnical Engineering, Xidian University, Xi'an 710071, China.
Jingjing LinThe 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214062, China.
Yuhe DuanThe 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214062, China.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

To meet the demands for miniaturization, lightweight design, and high performance in modern electronic systems, advanced 3D TSV technology enables a substantial increase in storage capacity even within physically constrained form factors. This paper proposes a schematic design methodology and system-level integrated modeling approach for a four-layer stacked micro-module based on wafer-level packaging. By leveraging heterogeneous chip fan-out technology and TSV-based vertical stacking, the fabricated DDR3 micro-module achieves a compact footprint of 14 × 9 × 3.5 mm, a storage capacity of 4 GB, and a 64-bit bus width. Compared to conventional board-level mounting, the module reduces the footprint area by 95%. Following comprehensive multi-level testing, the micro-module fully complies with standard protocol requirements, enabling a paradigm shift in form factors for mobile computing devices while enhancing computational density and energy efficiency in data center server applications.

Indexed as

3D TSVmulti-level collaborative designwafer-level fan-outwafer-level packaging

Identifiers

PMID42076235
PMCPMC13117975

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.