Evidence map›Paper›PMID 42076234›Full record

ReviewMicromachines2026

Reduction in Dark Current in Photodiodes: A Review.

Alper Ülkü, Ralph Potztal, Tobias Blaettler, Cengiz Tuğsav Küpçü, Reto Besserer, Dietmar Bertsch, Tina Strüning, Samuel Huber

Abstract readReview
PubMed Full text at PMC Publisher
In one paragraph

Review in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Alper ÜlküESPROS Photonics AG, 7320 Sargans, Switzerland.ORCID 0000-0002-3033-9406
Ralph PotztalESPROS Photonics AG, 7320 Sargans, Switzerland.
Tobias BlaettlerESPROS Photonics AG, 7320 Sargans, Switzerland.
Cengiz Tuğsav KüpçüESPROS Photonics AG, 7320 Sargans, Switzerland.
Reto BessererOST-Eastern Switzerland University of Applied Sciences, 9471 Buchs, Switzerland.
Dietmar BertschOST-Eastern Switzerland University of Applied Sciences, 9471 Buchs, Switzerland.
Tina StrüningOST-Eastern Switzerland University of Applied Sciences, 9471 Buchs, Switzerland.
Samuel HuberOST-Eastern Switzerland University of Applied Sciences, 9471 Buchs, Switzerland.

Funding

Innosuisse - Swiss Innovation Agency 127.808 IP-ENG
6 · The paper itself

Abstract

Dark current represents a fundamental limiting factor in photodiode performance, establishing the noise floor and constraining detectivity in low-light applications. This comprehensive literature review examines publications covering the physical mechanisms underlying dark current generation and diverse techniques employed for its reduction. Covered mechanisms include diffusion current, Shockley-Read-Hall (SRH) generation-recombination, trap-assisted tunneling, band-to-band tunneling, and surface leakage, each examined with respect to its physical origin and characteristic signatures. Reduction strategies are categorized into thermal management approaches, surface passivation techniques including atomic-layer-deposited aluminum oxide (ALD Al

Indexed as

ALD passivationavalanche photodiodeCMOS image sensordark currentgermaniumgetteringguard ringphotodiodeShockley–Read–HallsiliconSPADsurface passivation

Identifiers

PMID42076234
PMCPMC13117859

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.