10 authors.
Siyuan RenInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Muhammad AbbasInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Zhibin XieInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Zilin LuInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Jasim YousafInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Muhammad IshaqInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.ORCID https://orcid.org/0000-0002-5308-7811 Zhuanghao ZhengInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.ORCID https://orcid.org/0000-0002-2475-9826 Jun ZhaoInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.
Shuo ChenInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.ORCID https://orcid.org/0000-0003-1512-376X Guangxing LiangInstitute of Thin Film Physics and Applications, Shenzhen Key Laboratory of Advanced Thin Films and Applications, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, State Key Laboratory of Intelligent Construction and Healthy Operation and Maintenance of Deep Underground Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University Shenzhen 518060 China abbas.cssp@hotmail.com chensh@szu.edu.cn lgx@szu.edu.cn.ORCID https://orcid.org/0000-0002-9033-4885 No grant is acknowledged in the PubMed record.