Evidence map›Paper›PMID 42008492›Full record

ArticlePloS one2026

YOLO-BP for detection of multi-scale and high intra-class variation electrode cap defects in resistance spot welding.

Xiaomin Zhao, Siow Hoo Leong, Beng Yong Lee, Sofianita Mutalib, Bangchao Qiu, Meng Lyu, Zhijun Zuo

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Article in PloS one, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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1 · What the graph read from it

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2 · The registry

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3 · Its place in the literature

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4 · The record

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5 · Who and what money

Authors and funding

7 authors.

Xiaomin ZhaoCollege of Automotive Engineering, Guangdong Polytechnic of Industry and Commerce, Guangzhou, China.
Siow Hoo LeongFaculty of Computer and Mathematical Sciences, Universiti Teknologi MARA, Kota Samarahan, Sarawak, Malaysia.ORCID https://orcid.org/0000-0002-0325-0115
Beng Yong LeeFaculty of Computer and Mathematical Sciences, Universiti Teknologi MARA, Kota Samarahan, Sarawak, Malaysia.ORCID https://orcid.org/0000-0002-3569-5821
Sofianita MutalibFaculty of Computer and Mathematical Sciences, Universiti Teknologi MARA, Shah Alam, Selangor, Malaysia.
Bangchao QiuGuangzhou MINO Equipment Co., Ltd., Guangzhou, China.
Meng LyuCollege of Automotive Engineering, Guangdong Polytechnic of Industry and Commerce, Guangzhou, China.
Zhijun ZuoGuangzhou MINO Equipment Co., Ltd., Guangzhou, China.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Inspection of electrode cap surface conditions is crucial in resistance spot welding. Current solutions largely rely on manual inspection or sensor-based approaches, with limited exploration into vision-based approaches. This paper proposes a vision-based defect detection framework, YOLO-BP, for inspecting electrode cap tip surface defects, particularly the black burn mark defects that exhibit high variability in appearance. The key contribution is the incorporation of a new attention mechanism, BiLevel Spatial Selective Attention (BSSA), which synergistically integrates hierarchical and selective attentions within the YOLOv13 architecture. The hierarchical attention utilizes BiLevel Spatial Attention Module (BSAM) to strengthen extraction of global defect geometry when defects are spatially spread, and local defect irregularities when defects are small or dispersed. Meanwhile, the selective attention employs Partial Convolution (PConv) module to selectively detect defect-sensitive regions. To facilitate evaluation of defect detection, a new annotated Electrode Cap Tip Surface Defect (ECTSD) Dataset containing diverse electrode cap tip surface defects is constructed. The results show that YOLO-BP, achieves 66.5% mAP@0.5 and 31.3% mAP@0.5-0.95, corresponding to improvement of 2.9% and 2.1% respectively over the YOLOv13 baseline, along with gains of 1.7% in recall and 1.1% in F1-Score are observed, while maintains efficient inference time of 0.8 ms. Compared with YOLOv13 integrated with the Convolutional Block Attention Module (CBAM), YOLO-BP demonstrates a clear advantage in detecting the diverse defects, achieving 4.5% higher in mAP@0.5 and 8% higher in mAP@0.5-0.95. Furthermore, it attains the highest F1-Score of 67.7% when benchmarked against YOLOv5 through YOLOv12. The superiority of entire defect detection indicating the effectiveness of YOLO-BP in minimizing false negatives, underscoring its practical application in industrial inspection for defects.

Indexed as

WeldingAlgorithmsDetection AlgorithmsElectrodes

Identifiers

PMID42008492
PMCPMC13095003

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.