On the optimization of the geometric pattern for structured illumination based X-ray phase contrast and dark-field imaging: a simulation study and its experimental validation.

Phase contrast and dark-field imaging are relatively new X-ray imaging modalities that provide additional information to conventional attenuation-based imaging. However, this new information comes at the price of a more complex acquisition scheme and optical components. Among the different techniques available, such as grating interferometry or edge illumination, modulation-based and more generally single-mask/grid imaging techniques simplify these new procedures to obtain phase and dark-field images by shifting the experimental complexity to the numerical post-processing side. This family of techniques involves inserting a membrane into the X-ray beam that locally modulates the intensity to create a pattern on the detector which serves as a reference. However, the topological nature of the mask used seems to determine the quality of the reconstructed phase and dark-field images. We present in this article an in-depth study of the impact of the membrane parameters used in a single-mask imaging approach. A spiral topology seems to be an optimum both in terms of resolution and contrast-to-noise ratio compared with random and regular patterns.