ArticleJournal of synchrotron radiation2026
Total-reflection-based microscope compatible with X-ray and visible light for sample positioning.
Article in Journal of synchrotron radiation, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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16 authors.
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Abstract
Sample positioning in X-ray imaging is often technically demanding and involves radiation exposure to the sample. For easier and damage-free positioning, the integration of a visible-light microscope is an effective and widely adopted approach. However, such visible-light microscopes require careful calibration of the objective optic against the X-ray microscope, which introduces additional challenges. To address this issue, we propose a simple total-reflection-based microscope compatible with X-rays and visible light using a Wolter mirror which functions as both X-ray condenser optic and visible-light objective optic. Calibrating our visible-light microscope requires only simple adjustment of an optical lens and three planar mirrors, while no adjustment of the objective optic. We constructed our proposed system for a soft X-ray ptychography system and successfully demonstrated the simple calibration of the visible-light microscope, which was then applied to position a biological sample without delivering a radiation dose.
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