Evidence map›Paper›PMID 41957372›Full record

ArticleNature communications2026

Thermal Force Imaging of Hot Electrons in Operando Nanodevices.

Weikang Lu, Ziyi Xu, Hewan Zhang, Svend Age Biehs, Achim Kittel, Ludi Qin, Xue Gong, Huanyi Xue, Yanru Song, Zhengyang Zhong and 4 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nature communications, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Weikang LuState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Ziyi XuState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Hewan ZhangState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Svend Age BiehsInstitut für Physik, Carl von Ossietzky Universität, Oldenburg, Germany.
Achim KittelInstitut für Physik, Carl von Ossietzky Universität, Oldenburg, Germany.
Ludi QinState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Xue GongState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Huanyi XueState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Yanru SongShanghaiTech Material and Device Lab (SMDL), ShanghaiTech University, Shanghai, China.ORCID http://orcid.org/0009-0004-8105-244X
Zhengyang ZhongState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.
Shiyou ChenState Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, China.ORCID http://orcid.org/0000-0002-4039-8549
Kun DingState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China.ORCID http://orcid.org/0000-0002-0185-2227
Wei LuSchool of Physical Science and Technology, ShanghaiTech University, Shanghai, China. luwei@shanghaitech.edu.cn.ORCID http://orcid.org/0000-0001-9859-8394
Zhenghua AnState Key Laboratory of Surface Physics, Department of Physics, Fudan University, Shanghai, China. anzhenghua@fudan.edu.cn.ORCID http://orcid.org/0000-0001-8664-6184

Funding

National Natural Science Foundation of China (National Science Foundation of China) Grant Nos. 11991060/12027805/12474042
6 · The paper itself

Abstract

The relentless pursuit of smaller, faster nanoelectronics concentrates intense heat at nanometer scales, threatening performance and reliability. Yet directly mapping this heat from nonequilibrium hot electrons has remained elusive. Here we introduce the non-contact force technique that directly images hot-electron temperature distributions in operando devices. Using a bimodal atomic force microscope with sideband modulation, we harness frequency mixing to greatly boost sensitivity to hot-electron forces while suppressing parasitic electrostatic signals. This enables a thermal force microscope that visualizes hot electrons in the nanoconstriction of a silicon channel. Quantitative analysis reveals that thermal-fluctuation-induced force from hot electrons (

Identifiers

PMID41957372
PMCPMC13222865

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.