Evidence map›Paper›PMID 41924172›Full record

ArticleNature electronics2026

Metallic charge transport in conjugated molecular bilayers.

Kuakua Lu, Yun Li, Qijing Wang, Linlu Wu, Xinglong Ren, Xu Chen, Luhao Liu, Yating Li, Xiaoming Xu, Qingkai Zhang and 21 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nature electronics, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

31 authors.

Kuakua Lu *School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0009-0000-6854-5769
Yun Li *School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0003-1753-7317
Qijing Wang *School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0003-0115-5330
Linlu Wu *Beijing Key Laboratory of Optoelectronic Functional Materials and Micro-Nano Devices, School of Physics, Renmin University of China, Beijing, China.ORCID 0000-0002-8738-6676
Xinglong RenOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.ORCID 0000-0001-9824-5767
Xu ChenSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.
Luhao LiuSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.
Yating LiSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.
Xiaoming XuCollege of Engineering and Applied Sciences, National Laboratory of Solid-State Microstructures, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Qingkai ZhangSchool of Physics, Nanjing Institute of Atomic-Level Manufacturing, Nanjing University, Nanjing, China.
Di WangSchool of Physics, Nanjing Institute of Atomic-Level Manufacturing, Nanjing University, Nanjing, China.
Liqi ZhouCollege of Engineering and Applied Sciences, National Laboratory of Solid-State Microstructures, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0002-6498-4518
Mingfei XiaoOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.
Sai JiangSchool of Microelectronics and Control Engineering, Changzhou University, Changzhou, China.
Mengjiao PeiSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.
Haoxin GongOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.
William WoodOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.
Ian E JacobsOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.ORCID 0000-0002-1535-4608
Junzhan WangOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.
Gang ChenSchool of Physical Science and Technology, ShanghaiTech University, Shanghai, China.
Peng WangDepartment of Physics, University of Warwick, Coventry, UK.ORCID 0000-0003-0788-6687
Zhaosheng LiCollege of Engineering and Applied Sciences, National Laboratory of Solid-State Microstructures, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0001-8114-0432
Chunfeng ZhangSchool of Physics, Nanjing Institute of Atomic-Level Manufacturing, Nanjing University, Nanjing, China.ORCID 0000-0001-9030-5606
Xinran WangSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0002-3975-1667
Xu WuSchool of Integrated Circuits and Electronics & School of Multidisciplinary Science & School of Physics, Beijing Institute of Technology, Beijing, China.ORCID 0000-0002-2252-322X
Yeliang WangSchool of Integrated Circuits and Electronics & School of Multidisciplinary Science & School of Physics, Beijing Institute of Technology, Beijing, China.ORCID 0000-0002-8896-0748
Wei JiBeijing Key Laboratory of Optoelectronic Functional Materials and Micro-Nano Devices, School of Physics, Renmin University of China, Beijing, China.ORCID 0000-0001-5249-6624
Songlin LiSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0002-3995-9580
Jingsi QiaoSchool of Integrated Circuits and Electronics & School of Multidisciplinary Science & School of Physics, Beijing Institute of Technology, Beijing, China.ORCID 0000-0001-6464-5500
Yi ShiSchool of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Collaborative Innovation Centre of Advanced Microstructures, Nanjing University, Nanjing, China.ORCID 0000-0002-1082-0315
Henning SirringhausOptoelectronics Group, Cavendish Laboratory, Cambridge, UK.ORCID 0000-0001-9827-6061

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Metallic charge transport of field-induced carriers can be observed in single-crystal silicon over a wide temperature range. Such behaviour is rare in undoped organic semiconductors but is beneficial for engineering devices with advanced performance. Here we report metallic charge transport in conjugated molecular bilayers down to 8 K with an electrical conductivity of up to 245 S cm

Indexed as

Electronic devicesTwo-dimensional materials

Identifiers

PMID41924172
PMCPMC13035466

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.