LHO-net: A Lightweight Steel Defect Detection Framework Based on Cross-Scale Feature Selection and Adaptive Optimization.

To address the issues of poor adaptability to complex scenarios, high computational complexity, and difficulties in terminal deployment of existing steel surface defect detection models, a novel lightweight detection network named LHO-net is proposed, with the Lightweight Multi-Backbone (LM Backbone), the Hierarchical Scale-based Pyramid Attention Network (HSPAN), and the Occlusion-aware Detection Head (OAHead). The LM Backbone adopts a dual-branch structure with shared HGStem and a dynamic feature fusion mechanism, effectively capturing multi-dimensional features of irregular defects while extremely compressing model parameters. The HSPAN module realizes efficient fusion of multi-scale features through dynamic feature selection and adaptive upsampling strategies, balancing background noise suppression and defect detail preservation. The OAHead completes adaptive compensation of features in occluded regions by means of deep feature aggregation and exponential normalization technology, significantly enhancing the ability to recognize complex defects. On the NEU-DET dataset, LHO-net achieves a mAP@0.5 of 75.0%, a mAP@0.5:0.95 of 44.0%, and a recall of 73.6%, with a computational complexity of only 2.3 GFLOPS. Compared with the baseline model YOLOv12, it reduces parameters by 64% and computational cost by 60.3%. On the GC-10 dataset, its mAP@0.5 reaches 67.2%, and its detection stability for complex defects such as slender creases and low-contrast water spots is superior to that of mainstream lightweight YOLO variants. Visualization results confirm that the model can effectively avoid common problems such as redundant annotations and false detections and maintains stable recognition performance for various defects. It solves the core contradiction between detection accuracy and lightweight deployment in industrial scenarios, providing an efficient and practical technical solution for real-time steel surface defect detection on resource-constrained terminal devices.