ArticleSensors (Basel, Switzerland)2026
A Data-Constrained and Physics-Guided Conditional Diffusion Model for Electrical Impedance Tomography Image Reconstruction.
Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Electrical impedance tomography (EIT) provides noninvasive, high-temporal-resolution imaging for medical and industrial applications. However, accurate image reconstruction remains challenging due to the severe ill-posedness and nonlinearity of the inverse problem, as well as the limited robustness of existing single-source learning-based methods in real measurement scenarios. To address these limitations, a data-constrained and physics-guided Multi-Source Conditional Diffusion Model (MS-CDM) is proposed for EIT image reconstruction. Unlike conventional conditional diffusion methods that rely on a single measurement or an image prior, MS-CDM utilizes boundary voltage measurements as data-driven constraints and incorporates coarse reconstructions as physics-guided structural priors. This multi-source conditioning strategy provides complementary guidance during the reverse diffusion process, enabling balanced recovery of fine boundary details and global topological consistency. To support this framework, a Hybrid Swin-Mamba Denoising U-Net is developed, combining hierarchical window-based self-attention for local spatial modeling with bidirectional state-space modeling for efficient global dependency capture. Extensive experiments on simulated datasets and three real EIT experimental platforms demonstrate that MS-CDM consistently outperforms state-of-the-art numerical, supervised, and diffusion-based methods in terms of reconstruction accuracy, structural consistency, and noise robustness. Moreover, the proposed model exhibits robust cross-system applicability without system-specific retraining under multi-protocol training, highlighting its practical applicability in diverse real-world EIT scenarios.
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