Evidence map›Paper›PMID 41753833›Full record

ArticleMicromachines2026

Investigation of III-Nitride MEMS Pressure Sensor for High-Temperature Applications.

Makhluk Hossain Prio, Maruf Morshed, Lavanya Muthusamy, Md Sohanur E Hijrat Raju, Itmenon Towfeeq, Durga Gajula, Goutam Koley

Abstract read
In one paragraph

Article in Micromachines, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Makhluk Hossain PrioHolcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29634, USA.ORCID 0009-0006-5938-6122
Maruf MorshedHolcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29634, USA.ORCID 0009-0008-8626-0626
Lavanya MuthusamyTexas Instruments, Dallas, TX 75243, USA.ORCID 0009-0000-5302-2287
Md Sohanur E Hijrat RajuHolcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29634, USA.
Itmenon TowfeeqModjoul Inc., Greenville, SC 29615, USA.
Durga GajulaInstitute for Matters and Systems (IMS), Georgia Institute of Technology, Atlanta, GA 30332, USA.
Goutam KoleyHolcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29634, USA.

Funding

U.S. National Science Foundation TI-2234512
6 · The paper itself

Abstract

High-temperature operation of AlGaN/GaN Heterojunction Field Effect Transistor embedded diaphragm-based MEMS pressure sensors have been investigated, which utilized their wide bandgap and piezo resistivity to perform stably at elevated temperatures. The performance of the pressure sensor was observed over a change in applied pressure of 35 kPa, which resulted in an experimentally measured change in drain-source resistance (Δ

Indexed as

COMSOL simulationgallium nitridehigh temperatureMEMSpiezoelectricpolarizationpressure sensorpressure transducersensitivitystrain

Identifiers

PMID41753833
PMCPMC12943334

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.