ArticleMaterials (Basel, Switzerland)2026
Effects of Annealing on the Radio Frequency Sputtered CuO/ZnO Thin Film Heterostructure for Optoelectronic Applications.
Article in Materials (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
ZnO and CuO thin films were deposited separately using the radio frequency (RF) sputtering technique, and the effect of annealing in nitrogen and oxygen ambient environments was investigated. In this article, structural, optical, vibrational, and electrical characterizations were sequentially performed using techniques such as X-ray diffraction (XRD), UV-visible spectroscopy (UV-vis), Raman spectroscopy, photoluminescence (PL) spectroscopy, and current-voltage measurements using a DC four-probe station. XRD confirmed a high-crystallinity and wurtzite structure for ZnO, with the preferred orientation being along the c-axis (0001), and a monoclinic structure for CuO, with preferential orientation along the (002) axis. The absorption edges of the ZnO and CuO thin films were determined to be 3.24 eV and 2.89 eV, respectively. However, Urbach tails were observed only in the ZnO thin films, confirming the presence of localized Zn interstitials and oxygen vacancies. The absorption of CuO showed weak Urbach tails, suggesting that the defects were not localized. Raman spectroscopy performed on the ZnO and CuO thin films showed the appearance of weak E
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