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ArticleEntropy (Basel, Switzerland)2026

MFE-YOLO: A Multi-Scale Feature Enhanced Network for PCB Defect Detection with Cross-Group Attention and FIoU Loss.

Ruohai Di et al.PubMed ↗Full text ↗Publisher ↗

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1 paper cites it

2026

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MFE-YOLO: A Multi-Scale Feature Enhanced Network for PCB Defect Detection with Cross-Group Attention and FIoU Loss. | OpenQuestion