Evidence map›Paper›PMID 41744402›Full record

ArticleSmall (Weinheim an der Bergstrasse, Germany)2026

Virtualization as a New Scaling Law for Semiconductor Devices Beyond Geometric Scaling.

Zeheng Wang, Xinghuan Chen, Fanfan Lin, Xinze Li, Fangzhou Wang, Songnan Guo, Simin Yu, Liang Li, Jing-Kai Huang

Abstract read
In one paragraph

Article in Small (Weinheim an der Bergstrasse, Germany), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Zeheng WangManufacturing, CSIRO, Sydney, NSW, Australia.ORCID https://orcid.org/0000-0002-6994-1234
Xinghuan ChenChina Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China.
Fanfan LinZhejiang University - University of Illinois Urbana-Champaign Institute, Zhejiang, China.
Xinze LiUniversity of Arkansas, Fayetteville, Arkansas, USA.
Fangzhou WangShenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China.
Songnan GuoNVIDIA Semiconductor Technology (Shanghai) Co., Ltd, Shanghai, China.
Simin YuIntel Chengdu Products Co., Ltd, Chengdu, China.
Liang LiAcademy for Advanced Interdisciplinary Studies, Peking University, Beijing, China.
Jing-Kai HuangSchool of Materials Science and Engineering, University of New South Wales, Sydney, NSW, Australia.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

As Moore's-law-driven geometric scaling nears physical, economic, and sustainability limits, semiconductor progress is increasingly constrained by the cost and latency of physical iteration. This Perspective argues that AI enables virtualization as a complementary scaling law: progress scales with how much trustworthy virtual evidence can replace exhaustive fabrication, testing, and qualification across the device lifecycle. We show how virtualization emerges in i) design and modeling via surrogate and physics-informed learning, inverse design, and uncertainty-aware exploration; ii) fabrication and packaging via digital twins, virtual metrology, and reinforcement learning; and iii) qualification via defect inference and reliability modeling that provide earlier risk signals. We outline boundary conditions-trust and uncertainty, cross-stage coherence, sustainability, and governance-and argue that future innovation will depend not only on geometric shrinkage, but also on the fidelity, integration, and stewardship of virtual evidence.

Indexed as

artificial intelligencefabricationmachine learningscaling lawsemiconductor devices

Identifiers

PMID41744402
PMCPMC13003268

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.